Deep Reflectance Maps

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2016) Deep Reflectance Maps.
In: 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016.
Conference: CVPR IEEE Conference on Computer Vision and Pattern Recognition

Full text not available from this repository.
Official URL: https://doi.org/10.1109/CVPR.2016.488
Item Type: Conference or Workshop Item (A Paper) (Paper)
Conference: CVPR IEEE Conference on Computer Vision and Pattern Recognition
Depositing User: Sebastian Weisgerber
Date Deposited: 16 Jan 2018 13:19
Last Modified: 18 Jul 2019 11:48
Primary Research Area: NRA1: Trustworthy Information Processing
URI: https://publications.cispa.saarland/id/eprint/1334

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