Deep Reflectance Maps

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2016) Deep Reflectance Maps.
In: 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016.
Conference: CVPR - IEEE Conference on Computer Vision and Pattern Recognition

Full text not available from this repository.
Official URL: https://doi.org/10.1109/CVPR.2016.488

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