Dynamic Tainting for Automatic Test Case Generation

Mathis, Björn
(2017) Dynamic Tainting for Automatic Test Case Generation.
In: Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis.
Conference: ISSTA International Symposium on Software Testing and Analysis

[img]
Preview
Text
issta17-docid6.pdf

Download (423kB) | Preview
Official URL: http://doi.acm.org/10.1145/3092703.3098233

Actions

Actions (login required)

View Item View Item