Hilbertian Metrics on Probability Measures and Their Application in SVM?s

Hein, Matthias and Lal, Thomas Navin and Bousquet, Olivier
(2004) Hilbertian Metrics on Probability Measures and Their Application in SVM?s.
In: Pattern Recognition, 26th DAGM Symposium, August 30 - September 1, 2004, Tübingen, Germany, Proceedings.

Full text not available from this repository.
Official URL: https://doi.org/10.1007/978-3-540-28649-3_33
Item Type: Conference or Workshop Item (A Paper) (UNSPECIFIED)
Depositing User: Sebastian Weisgerber
Date Deposited: 22 Feb 2018 11:11
Last Modified: 22 Feb 2018 11:11
URI: https://publications.cispa.saarland/id/eprint/1928

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