Calibrated Mutation Testing

Nam, Jaechang and Schuler, David and Zeller, Andreas
(2011) Calibrated Mutation Testing.
In: Fourth IEEE International Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings.
Conference: ICST International Conference on Software Testing, Verification and Validation

Full text not available from this repository.
Official URL: https://doi.org/10.1109/ICSTW.2011.57

Actions

Actions (login required)

View Item View Item