Items where Author is "Chen, Yiqun T"

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Conference or Workshop Item (A Paper)

Chen, Yiqun T and Gopinath, Rahul and Tadakamalla, Anita and Ernst, Michael D and Holmes, Reid and Fraser, Gordon and Ammann, Paul and Just, Rene
(2020) Revisiting the Relationship Between Fault Detection,Test Adequacy Criteria, and Test Set Size.
In: The 35th IEEE/ACM International Conference on Automated Software Engineering..
Conference: ASE Automated Software Engineering Conference

This list was generated on Sat Dec 21 03:40:33 2024 CET.
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