Local Analysis for Global Inputs

Kampmann, Alexander
(2017) Local Analysis for Global Inputs.
In: 39th International Symposium on Software Engineering, May 20-28, 2017, Buenos Aires.

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Abstract

Fuzz testing and symbolic test generation both face their own challenges. While symbolic testing has scalability issues, fuzzing cannot uncover faults which require carefully engineered inputs. In this paper I propose a combination of both approaches, compensating weaknesses of each approach with the strength of the other approach. I present my plans for evaluation, which include applications of the hybrid tool to programs which neither of the approaches can handle on its own.

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