(2017) O!Snap: Cost-Efficient Testing in the Cloud.
In: 2017 IEEE International Conference on Software Testing, Verification and Validation, ICST 2017, Tokyo, Japan, March 13-17, 2017.
Conference:
ICST International Conference on Software Testing, Verification and Validation
Official URL: https://doi.org/10.1109/ICST.2017.51
Item Type: | Conference or Workshop Item (A Paper) (Paper) |
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Divisions: | Andreas Zeller (Software Engineering, ST) |
Conference: | ICST International Conference on Software Testing, Verification and Validation |
Depositing User: | Ben Stock |
Date Deposited: | 14 Feb 2018 10:54 |
Last Modified: | 18 Jul 2019 12:12 |
Primary Research Area: | NRA5: Empirical & Behavioral Security |
URI: | https://publications.cispa.saarland/id/eprint/1431 |
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