Items where Author is "Gavves, Efstratios"

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Conference or Workshop Item (A Paper)

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2016) Deep Reflectance Maps.
In: 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016.
Conference: CVPR IEEE Conference on Computer Vision and Pattern Recognition

Article

Georgoulis, Stamatios and Rematas, Konstantinos and Ritschel, Tobias and Gavves, Efstratios and Fritz, Mario and Gool, Luc Van and Tuytelaars, Tinne
(2018) Reflectance and Natural Illumination from Single-Material Specular Objects Using Deep Learning.
Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 40 (8). pp. 1932-1947. ISSN 0162-8828

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2015) Deep Reflectance Maps.
CoRR, abs/15.

This list was generated on Mon May 23 00:03:49 2022 CEST.