Items where Author is "Nam, Jaechang"

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Conference or Workshop Item

Nam, Jaechang and Schuler, David and Zeller, Andreas
(2011) Calibrated Mutation Testing.
In: Fourth IEEE International Conference on Software Testing, Verification and Validation, ICST 2012, Berlin, Germany, 21-25 March, 2011, Workshop Proceedings.
Conference: ICST - International Conference on Software Testing, Verification and Validation

This list was generated on Fri Apr 26 00:03:29 2019 CEST.