Items where Author is "Ritschel, Tobias"

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Number of items: 13.

Conference or Workshop Item (A Paper)

Maximov, Maxim and Leal-Taixe, Laura and Fritz, Mario and Ritschel, Tobias
(2019) Deep Appearance Maps.
In: International Conference on Computer Vision (ICCV).
Conference: ICCV IEEE International Conference on Computer Vision

Georgoulis, Stamatios and Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Tuytelaars, Tinne and Gool, Luc Van
(2017) What is Around the Camera?
In: IEEE International Conference on Computer Vision, ICCV 2017, Venice, Italy, October 22-29, 2017.
Conference: ICCV IEEE International Conference on Computer Vision

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2016) Deep Reflectance Maps.
In: 2016 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2016, Las Vegas, NV, USA, June 27-30, 2016.
Conference: CVPR IEEE Conference on Computer Vision and Pattern Recognition

Pepik, Bojan and Stark, Michael and Gehler, Peter and Ritschel, Tobias and Schiele, Bernt
(2015) 3D Object Class Detection in the Wild.
In: IEEE Conference on Computer Vision and Pattern Recognition Workshops (3DSI 2015).

Pepik, Bojan and Benenson, Rodrigo and Ritschel, Tobias and Schiele, Bernt
(2015) What is Holding Back Convnets for Detection?
In: Pattern Recognition (GCPR 2015).

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Tuytelaars, Tinne
(2014) Image-Based Synthesis and Re-synthesis of Viewpoints Guided by 3D Models.
In: 2014 IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014, Columbus, OH, USA, June 23-28, 2014.
Conference: CVPR IEEE Conference on Computer Vision and Pattern Recognition

Article

Georgoulis, Stamatios and Rematas, Konstantinos and Ritschel, Tobias and Gavves, Efstratios and Fritz, Mario and Gool, Luc Van and Tuytelaars, Tinne
(2018) Reflectance and Natural Illumination from Single-Material Specular Objects Using Deep Learning.
Transactions on Pattern Analysis and Machine Intelligence (TPAMI), 40 (8). pp. 1932-1947. ISSN 0162-8828

Rematas, Konstantinos and Nguyen, Chuong H. and Ritschel, Tobias and Fritz, Mario and Tuytelaars, Tinne
(2017) Novel Views of Objects from a Single Image.
IEEE Trans. Pattern Anal. Mach. Intell., 39 (8). pp. 1576-1590.

Georgoulis, Stamatios and Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gool, Luc J. Van and Tuytelaars, Tinne
(2016) DeLight-Net: Decomposing Reflectance Maps into Specular Materials and Natural Illumination.
CoRR, abs/16.

Georgoulis, Stamatios and Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Tuytelaars, Tinne and Gool, Luc Van
(2016) Natural Illumination from Multiple Materials Using Deep Learning.
CoRR, abs/16.

Rematas, Konstantinos and Nguyen, Chuong H. and Ritschel, Tobias and Fritz, Mario and Tuytelaars, Tinne
(2016) Novel Views of Objects from a Single Image.
CoRR, abs/16.

Rematas, Konstantinos and Ritschel, Tobias and Fritz, Mario and Gavves, Efstratios and Tuytelaars, Tinne
(2015) Deep Reflectance Maps.
CoRR, abs/15.

Monograph

Maximov, Maxim and Ritschel, Tobias and Fritz, Mario
(2018) Deep Appearance Maps.
Technical Report. UNSPECIFIED.

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